Combined RIXS and XPS
The station is currently under commissioning.
The PEAXIS (PhotoElectron Analysis and X-ray Inelastic Spectroscopy) is a fixed experimental station installed at the U41-PEAXIS beamline. It is dedicated to studies of angle-resolved RIXS (Resonant Inelastic X-ray Scattering) and PES (PhotoElectron Spectroscopy) on solids and liquid cells. As shown in the Schematic figure below, the station is equipped with an electron energy analyzer (violet) and a RIXS spectrometer (blue). Various sample manipulators (red) can be installed in the sample chamber (green) according to different sample environments. The RIXS spectrometer includes a grating chamber (dark blue), a five-meter RIXS arm (light blue) and a CCD detector (orange). The RIXS arm is continuously rotatable on a supporting rail in a range of 106.5 degrees.
|Experiment in vacuum||yes|
|Temperature range||20 ~ 1000 K|
|Detector||A hemispherical energy analyzer (SPECS PHOIBOS 150) for electron detections; a CCD camera (Andor iKon-L) for X-ray detections; two mass spectrometers for mass detections in the loadlock and sample chamber, respectively; an ammeter (Keithley 6514) for sample drain current measurements|
|Manipulators||One liquid-cell manipulator with translational movements along XYZ axes and rotational movement around Z axis; two solid sample manipulators with full translational and rotational movements along XYZ axes covering two temperature ranges of 20 K ~ RT and LN ~ 1000 K|
|RIXS gratings||Two VLS gratings of 2400 l/mm covering two energy ranges of 200 - 600 eV and 400 - 1200 eV|
|Sample treatment||Ar sputtering and annealing|
MethodsNEXAFS, EXAFS, Angular-resolved PES, XPS, RIXS
- K. Lieutenant, T. Hofmann, C. Zendler, C. Schulz, E. F. Aziz and K. Habicht, Numerical optimization of a RIXS spectrometer using raytracing simulations, Journal of Physics: Conference Series (2016). DOI: 10.1088/1742-6596/738/1/012104
- K. Lieutenant, T. Hofmann, C. Schulz, M. Yablonskikh, K. Habicht, E. F. Aziz. Design Concept of the High-Resolution End-station PEAXIS at BESSY II: Wide-Q-Range RIXS and XPS Measurements on Solids, Solutions, and Interfaces. J. El. Spec. Rel. Phen. (2016). DOI: 10.1016/j.elspec.2015.08.009