Nondestructive testing in analytical chemistry
The BAMline is specialized for nondestructive material characterization using different methods. The main applications of the monochromatic radiation with photon energies up to 60 keV are X-ray fluorescence analysis, micro computed tomography, X-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV is available for radiometric applications. Depending on the requirements the used beam size varies between 1.5µm and 10mm.Selected Applications:
- Measuring the elemental distributions in biological samples
- Determination of corrosion processes
- Real time analysis of catalytic reactions
depends on experiment - please discuss with Instrument Scientist
|Energy range||4.5 keV - 60 keV|
|Focus size (hor. x vert.)||DMM: vert. 0.15 mm between 35 m and 45 m from source; DCM: hor. 0.25 mm at 37 m from source|
|Phone||+49 30 8104 5576|
|Temperature range||room temperature|
|Detector||Color X-Ray Camera pnCCD, e2V Si-Li, Bruker X-Flash, CCD, 4 elements SDD, optical microscope, sCMOS|
|Sample holder compatibility|
|Additional equipment||Optical microscope for alignment purposes; microscopy images can be saved at every measurement coordinate for correlation of measured data and microscopy|
The first hard x-ray beamline at BESSY II has been installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a double-multilayer monochromator and a double-crystal monochromator. Depending on the application, the two devices are used separately or in-line. The main applications of the monochromatic radiation with photon energies up to 60 keV are x-ray fluorescence analysis, micro computed tomography, x-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV is available for radiometric applications.
The BAMline is specialized for nondestructive material characterization using different methods. Depending on the requirements the used beam size varies between 1.5 and 10000µm.
Following methods are available:
1) μ-XRF mapping in scanning mode. Resolution depends on the used optics and can be selected between 1.5 and 200µm. Primary beam energy range is 5keV-65keV.
2) μ-XRF mapping with color x-ray camera CXC. Fast one shot imaging with resolution between 10 and 50µm. Primary beam energy range is 5keV-35keV.
3) 3D XRF-Mapping. In slicing, or x-ray sheet microscopy, the excitation of the sample is realized with a thin sheet-beam and the detection with the CXC. The stepwise movement of the sample allows getting the element distribution for each layer with one measurement. These layers can be combined to a full 3D data set for each element afterwards. Since the information is collected layer per layer, there is no need to apply reconstruction techniques, which can be the reason for artifacts in the results.
4) EXAFS and XANES. The acquisition of the energy-dependent absorption spectra on selected position at the sample is possible in fluorescence and absorption mode. Time resolved experiments are possible down to second range.
5) Optical microscope is available for alignment purposes. The microscopy images can be saved at every measurement coordinate, so that the correlation between the measured data and the microscopy is rather simple.
Different scanning environments for different sample sizes (from several micrometer to 150mm) are available at the beamline. Rotational units are available as well.
There is no vacuum environment available at the beamline, but it is possible to mount sample environments or reactors in the experimental hutch.
Temperature in experimental hutch is controlled.
For more information, please contact firstname.lastname@example.org (EXAFS, XANES, XRF).