XUV Diffractometer@UE46
XUV Diffractometer@UE46
The XUV Diffractometer@UE46_PGM-1 (XUV Diffractometer for Resonant Soft X-Ray Scattering) is situated at the elliptical undulator UE46_PGM-1, which provides soft x-rays with tunable polarization (linear, circular) in the energy range between 120 eV and 2000 eV. And is dedicated to explore electronic ordering phenomena, like magnetic, charge and orbital ordering by resonant soft x-ray scattering (RSXS) experiments. This versatile instrument is a UHV-compatible two-circle diffractometer operating in horizontal scattering geometry with the sample and detector rotations driven from outside vacuum by Huber circles with highest accuracy and stability. It allows to perform high quality diffraction experiments even from tiny crystals (< 100μm x 100μm) over a large angular range as well as measurements of specular reflectivity with very high accuracy. With the samples mounted directly to a LHe-flow-cryostat, sample temperatures below 4 K can be reached. Azimuthal rotation in situ is provided for azimuth-dependent measurements. Photons are detected by an AXUV100-type photodiode with a set of changeable slits in front for optimizing the q-resolution. The detector can be scanned in the direction perpendicular to the scattering plane. This allows to compensate possible Chi-misalignment without compromising about the lowest sample temperatures. The experimental setup allows for x-ray absorption (XAS) masurements by parallel monitoring of the sample drain current (TEY measurements) as well as for FY measurements. The instrument is flexible and can adapt to special sample mounting. The UE46_PGM-1 beamline also hosts the High-Field Diffractometer, an instrument for RSXS and XAS studies in magnetic fields up to 7 Tesla. It is possible to switch between both instruments within the same beam time.
Selected Applications:- Diffraction from complex electronic ordering phenomena (magnetic, charge and orbital order)
- Interfacial electronic properties in heterostructures
- Magnetic structure determination from tiny single crystals and nanostructures
- Magnetization depth profiles
Methods
Elastic Scattering, Magnetic Scattering, REXS, XMCD, XMLD, Reflectometry
Remote access
depends on experiment - please discuss with Instrument Scientist
| Instrument data | |
|---|---|
| Phone (~49 30 8062-) | 14717 |
| Beam availability | 12h/d |
| Source | UE46_PGM-1 (elliptical undulator) |
| Monochromator | PGM |
| Energy range (at experiment) | 120 - 2000 eV |
| Energy resolution | 10 000 |
| Flux | 1012 |
| Polarisation |
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| Focus size (hor. x vert.) |
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| Temperature range | 3.8 - 320 K ( for T = 3.0 K contact Instrument Scientists) |
| Pressure range | 10-9 mbar |
| Detector | AXUV100 type photodiode; Drain current |
| Manipulators | x/y/z; phi (manual) |
| Sample holder compatibility |
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| Additional equipment | User equipment for in-situ applications can be accommodated: strain cell, four-probe resistivity, sample current, etc. |
| Additional information | Further details: beamline UE46_PGM-1 |