UE48_EMIL

Soft x-ray EMIL Beamline

Publications

2021

Kalha, C.; Fernando, N.K.; Bhatt, P.; Johansson, F.O.L.; Lindblad, A.; Rensmo, H.; Medina, L.Z.; Lindblad, R.; Siol, S.; Jeurgens, L.P.H.; Cancellieri, C.; Rossnagel, K.; Medjanik, K.; Schonhense, G.; Simon, M.; Gray, A.X.; Nemsak, S.; Lomker, P.; Schlueter, C.; Regoutz, A.: Hard x-ray photoelectron spectroscopy: A snapshot of the state-of-the-art in 2020. , Journal of Physics / Condensed Matter 33 (2021), p. 233001/1-44
doi: 10.1088/1361-648x/abeacd

2020

Wittkämper, H.; Maisel, S.; Wu, M.; Frisch, J.; Wilks, R.G.; Grabau, M.; Spiecker, E.; Bär, M.; Görling, A.; Steinrück, H.P.; Papp, C.: Oxidation induced restructuring of Rh-Ga SCALMS model catalyst systems. , The Journal of Chemical Physics 153 (2020), p. 104702/1-13
doi: 10.1063/5.0021647

UE48_EMIL