• Filatova, E.O.; Kozhevnikov, I.; Sokolov, A.A.; Ubyivovk, E.V.; Yulin, S.; Gorgoi, M.; Schäfers, F.: Soft x-Ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2 (Ti)/SiO2/Si stacks. Science and Technology of Advanced Materials 13 (2012), p. 015001/1-12

10.1088/1468-6996/13/1/015001
Open Access Version (externer Anbieter)