Többens, Daniel M.; Schorr, Susan: The use of anomalous x-ray diffraction as a tool for the analysis of compound semiconductors. Semiconductor Science and Technology 32 (2017), p. 103002/1-13
Open Accesn Version
We provide a review about the current and previous use of anomalous diffraction of x-rays in the analysis of compound semiconductors. Among the large number of available techniques, those that have been used in successful experiments on this class of compounds are identified. An exhaustive overview of the compound semiconductor systems that have been studied successfully is provided and the kind of results derived from experiments is discussed.