Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Mousel, M.; Redinger, A.; Siebentritt, S.; Raabe, D.: Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films. Journal of Applied Physics 118 (2015), p. 095302/1-10
10.1063/1.4929874