Business card Dr. Daniel Clemens

Dr. Daniel Clemens

 

  • Administration of neutron instrumentation for large scale structure investigation at BER-II (V4, V6, V16)
  • Instrument responsible in the field of neutron small-angle scattering (V16)
  • Project management neutron guide hall-II
  • Head of Colloid Physics group
  • Representative of neutron guide hall instruments

Curriculum vitae

 

Diploma work, Technische Universität Berlin, May 1989 : "Study of the roughness of multilayers"

Doktorarbeit, Technische Universität Berlin, 1993: "Study of growth, structure and magnetism of multilayers", Referees: F. Mezei, M. Steiner

1.2.1994-31.5.2002 Post-Doc and staff scientist at

Paul Scherrer Institut (PSI)
Labor für Neutronenstreuung ETH Zürich & PSI

Development and research on optical coatings for neutrons and Xrays, instrument responsible for a versatile 2-axis reflectometer/diffractometer (TOSPI, now: Morpheus) and the polarized neutron reflectometer AMOR

since 1.6.2002

Scientist at Helmholtz-Zentrum Berlin für Materialien und Energie GmbH
former Hahn-Meitner-Institut Berlin GmbH (HMI)

 

Refereeing/Advisory Teams

•European Workshop on Neutron Optics ’99 (NOP ‘99), Physica B 283, No. 4, 2000

•International instrument advisory team for the QUOKKA-SANS, Australian Nuclear Science and Technology Organisation (until 2005)

•Advisory commitee of Workshop on Neutron Delivery Systems, ILL Grenoble (1.-3.7.’09)

•International Conference on Small-Angle Scattering 2015, Member of the organization committee

•International Conference on Small-Angle Scattering 2018, Member of the international advisory committee

•IUCr Small-Angle Scattering Commision, Consultant

•Scientific and Technical Advisory Panel of the ESS for small-angle neutron scattering, member

•Joint Neutron Scattering Proposal Review Panel of the MLZ, reviewer

Scientific experience

• neutron and X-ray scattering instrumentation

• small-angle neutron scattering (SANS)

• solid state physics, thin film magnetism, crystallography

• reflectometry, using X-rays and polarized neutrons, SQUID, vibrating sample magnetometry, RBS, TEM, SEM, STM, layer deposition by sputtering

Publications