Joint Research Group - SyncLab
Soft X-ray absorption spectroscopy
With soft X-ray absorption spectroscopy (XAS) the K absorption edges of light elements such as carbon, nitrogen or oxygen and the L edges of transition metals can be probed, elucidating the chemical environment of e.g. molecular thin films. The use of a laser-produced plasma source in combination with a transmission spectrometer using reflection zone plates enables static[1], quick[2] as well as transient[3] measurements with high efficiency and high resolving power. Measurement times vary from sigle shots (500 ps) to minutes for static spectra to days for stable transient investigations.
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Instrument data |
NEXAFS spectrometer |
|
Source |
Lpp source using Yb:YAG thin disk laser and solid state target |
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Detectors |
CCD |
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Optics |
Reflection zone plates |
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Samples |
Thin homogeneous films (~100 nm – 500 nm), large areas (~ 1mm²) preferred |
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Experimental parameters |
|
|
Energy range |
200 eV – 1300 eV |
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Resolving power |
900 - 1400 |
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Pulse duration |
500 ps – 30 ns |
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Repetition rate |
100 Hz |
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Optical pump wavelength |
343 nm – 900 nm |
|
Pump probe delay |
Up to 43 ns |
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Minimal time resolution for quick XAS |
10 ms |
top: static [1], quick [2] spectra; bottom: transient spectra [3]