Öffnet in neuem Fenster Opens in a new window Öffnet externe Seite Opens an external site Öffnet externe Seite in neuem Fenster Opens an external site in a new window

Department X-Ray Microscopy

Beamline Specifications and Capabilities

This high flux beamline with a plane grating monochromator was designed especially for X-ray microscopy endstations. It is dedicated to X-ray microscopy applications and hosts the HZB X-ray microscope as a fixed endstation.

Detailed specifications of our X-ray beamline can be found here: U41-TXM

enlarged view

Microscope Layout

Beamline Specifications

Station data
Temperature range 100 K to room temperature
Pressure range samples under vacuum
Weitere Details XM - X-ray Microscopy
Beamline data
Segment L06
Location (Pillar) 7.2
Source U41 (planar undulator)
Monochromator PGM1 equipped with a 800 l/mm (soft X-rays) & 2000 l/mm (tender X-rays)
Energy range 180 - 1800 eV (soft X-ray range) & 700 - 2800 eV (tender X-ray range)
Energy resolution up to 10000
Flux up to 4·1012 photons/sec @100 mA and 20 μm exit slit for cff = 2.25 directly after the exit slit
Polarisation horizontal
Divergence horizontal photon energy dependent: 0.2 - 0.1 mrad
Divergence vertical photon energy dependent: 0.66 - 0.25 mrad
Focus size (hor. x vert.) 220 µm in exit slit
User endstation not possible
Distance Focus/last valve - focus at exit slit position - mm
Height Focus/floor level 1417 mm
Beam availability 12h/d
Phone +49 30 8062 12110
enlarged view

Measured flux curve

enlarged view

Measured energy resolution (Nitrogen-K-edge) for 1st and 2nd grating diffraction order