Publications 2009
Haug, J.; Kruth, H.; Dubiel, M.; Hofmeister, H.; Haas, S.; Tatchev, D.; Hoell, A.:
ASAXS study on the formation of core-shell Ag/Au nanoparticles in glass. Nanotechnology 20 (2009), p. 505705/1-8
doi: 10.1088/0957-4484/20/50/505705
Open Access (external provider)
Hoell, A.; Tatchev, D.; Haas, S.; Haug, J.; Bösecke, P.:
On the determination of partial structure functions in small-angle scattering exemplified by Al89Ni6La5 alloy. Journal of Applied Crystallography 42 (2009), p. 323-325
doi: 10.1107/S0021889808042453
Kasyutich, O.; Tatchev, D.; Hoell, A.; Ogrin, F.; Dewhurst, C.; Schwarzacher, W.:
Small angle x-ray and neutron scattering study of disordered and three dimensional-ordered magnetic protein arrays. Journal of Applied Physics 105 (2009), p. 07B528/1-3
doi: 10.1063/1.3075865
Open Access (external provider)
Klaus, M.; Reimers, W.; Genzel, Ch.:
Application of Energy-Dispersive Diffraction to the Analysis of Highly Inhomogeneous Residual Stress Fields in Thin Film Structures. In: Proceedings of the 57th Annual Conference on Applications of X-ray Analysis (Denver X-ray Conference) and the 8th International Conference on Residual Stresses (ICRS-8) ; 4 - 8 August 2008, Denver Marriott Tech Center Hotel, Denver, Colorado, USA Newton Square, Pa.: Internat. Centre for Diffraction Data, 2009 (Advances in X-ray analysis ; 52), p. 429-436
Kromm, A.; Kannengiesser, T.; Gibmeier, J.; Genzel, Ch.; van der Mee, V.:
Determination of Residual Stresses in Low Transformation Temperature (LTT -) Weld Metals Using X-Ray and High Energy Synchrotron Radiation. Welding in the World 53 (2009), p. 3-16
doi: 10.1007/BF03266687
Maawad, E.; Brokmeier, H.-G.; Wagner, L.; Genzel, C.:
Investigation of Near-Surface Stress Gradients in Shot Peened Ti-2.5Cu Measured by Mechanical and Diffraction Methods. In: H. El-Hofy [Ed.] : Proceedings of the 9th International Conference on Production Engineering, Design and Control : Alexandria, Egypt, 10-12 February 2009 , 2009, p. 1-9
Rodriguez-Alvarez, H.; Kötschau, I.M.; Genzel, C.; Schock, H.-W.:
Growth paths for the sulfurization of Cu-rich Cu/In thin films. Thin Solid Films 517 (2009), p. 2140-2144
doi: 10.1016/j.tsf.2008.10.091
Schumacher, G.; Darowski, N.; Zizak, I.; Klingelhöffer, H.; Neumann, W.:
Two-stage relaxation of damage structure in strongly creep-deformed single crystal superalloy SC16 measured by means of X-ray diffraction. Scripta Materialia 60 (2009), p. 88-91
doi: 10.1016/j.scriptamat.2008.09.009
Uhlmann, E.; Byrne, F.; Reimers, W.; Klaus, M.:
Drehen von AlSi-Legierungen mit CVD-diamantbeschichteten Werkzeugen. In: Forschung in Bewegung : 9. Magdeburger Maschinenbau-Tage ; 30.09. - 01.10.2009 ; TagungsbandUniv. , Magdeburg, 2009, p. [1-13]