Sing, M.; Berner, G.; Goss, K.; Mueller, A.; Ruff, A.; Wetscherek, A.; Thiel, S.; Mannhart, J.; Pauli, S.A.; Schneider, C.W.; Willmott, P.R.; Gorgoi, M.; Schaefers, F.; Claessen, R.: Profiling the Interface Electron Gas of LaAlO3/SrTiO3 Heterostructures with Hard X-Ray Photoelectron Spectroscopy. Physical Review Letters 102 (2009), p. 176805/1-4
10.1103/PhysRevLett.102.176805
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