Navirian, H. A.; Schick, D.; Gaal, P.; Leitenberger, W.; Shayduk, R.; Bargheer, M.: Thermoelastic study of nanolayered structures using time-resolved X-ray diffraction at high repetition rate. Applied Physics Letters 104 (2014), p. 021906/1-4
10.1063/1.4861873
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Abstract:
We investigate the thermoelastic response of a nanolayered sample composed of a metallic SrRuO3 electrode sandwiched between a ferroelectric Pb(Zr0.2Ti0.8)O3 film with negative thermal expansion and a SrTiO3 substrate. SrRuO3 is rapidly heated by fs-laser pulses with 208 kHz repetition rate. Diffraction of X-ray pulses derived from a synchrotron measures the transient out-of-plane lattice constant c of all three materials simultaneously from 120 ps to 5 μs with a relative accuracy up to Δc/c = 10−6. The in-plane propagation of sound is essential for understanding the delayed out-of-plane compression of Pb(Zr0.2Ti0.8)O3.