Klein, D. ; Wuensch, F. ; Kunst, M.: The determination of charge-carrier lifetime in silicon. Physica Status Solidi B 245 (2008), p. 1865-1876
10.1002/pssb.200879544
Abstract:
Contactless measurements of the photoconductance for the electrical characterization of silicon are discussed. The different techniques are presented and discussed. The theory for the interpretation of the measurements is given. At the hand of some exemplary experiments it is shown which information can be obtained from these measurements.