Examples for SEM results

SEM image depicting the microstructure of a
Cu(In,Ga)Se2 thin film

EBSD orientation distribution map of Si thin film

SEM image EBSD orientation distribution and pattern-
quality maps, also with Σ3 grain boundaries highlighted
by red lines as well as a panchromatic CL image, all acquired
at the identical position of a ZnO/CdS/ CuGaSe2/Mo/glass
cross-section specimen (see also: Abou-Ras et al.,
Sol. En. Mat. Sol. Cells 95 (2011) 1452)

SEM image (a), EBSD orientation-distribution map (b) with local orientations given by colors
(see legend), and EBIC image acquired at 8 keV (c) on the identical sample position of a
polished cross-section of a Cu(In,Ga)Se2 thin-film solar cell. The white arrows indicate the
position of the extracted EBIC profiles shown in (d). See also: Nichterwitz et al., Thin Solid Films
517 (2009) 2554.

Combined SEM (a), KPFM (b+c) and EBSD analyses (d+e) of grain boundaries in CuInSe2 thin film.
See also: R. Baier et al., Appl. Phys. Lett. 99 (2011) 172102